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Teilenummer | S-1004 |
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Beschreibung | VOLTAGE DETECTOR | |
Hersteller | Seiko Instruments | |
Logo | ||
Gesamt 30 Seiten S-1004 Series
www.sii-ic.com
© Seiko Instruments Inc., 2014
BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING)
VOLTAGE DETECTOR WITH SENSE PIN
Rev.2.1_00
The S-1004 Series is a high-accuracy voltage detector developed using CMOS technology. The detection voltage is fixed
internally with an accuracy of ±1.0% (−VDET(S) ≥ 2.2 V). It operates with current consumption of 500 nA typ.
Apart from the power supply pin, the detection voltage input pin (SENSE pin) is also prepared, so the output is stable even
if the SENSE pin falls to 0 V.
The release signal can be delayed by setting a capacitor externally, and the release delay time accuracy at Ta = +25°C is
±15%.
Two output forms Nch open-drain output and CMOS output are available.
Features
• Detection voltage:
1.0 V to 5.0 V (0.1 V step)
• Detection voltage accuracy:
±1.0% (2.2 V ≤ −VDET(S) ≤ 5.0 V)
±22 mV (1.0 V ≤ −VDET(S) < 2.2 V)
• Current consumption:
500 nA typ.
• Operation voltage range:
0.95 V to 10.0 V
• Hysteresis width:
5% ± 2%
• Release delay time accuracy: ±15% (CD = 4.7 nF, Ta = +25°C)
• Output form:
Nch open-drain output (Active "L")
CMOS output (Active "L")
• Operation temperature range: Ta = −40°C to +85°C
• Lead-free (Sn 100%), halogen-free
Applications
• Power supply monitor for microcomputer and reset for CPU
• Constant voltage power supply monitor for TV, Blu-ray recorder and home appliance
• Power supply monitor for portable devices such as notebook PC, digital still camera and mobile phone
Packages
• SOT-23-5
• SNT-6A
Seiko Instruments Inc.
1
BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN
S-1004 Series
Rev.2.1_00
4. 3 S-1004 Series CA type
Output form: CMOS output (Active "L")
Detection Voltage
1.0 V ± 22 mV
1.1 V ± 22 mV
1.2 V ± 22 mV
1.3 V ± 22 mV
1.4 V ± 22 mV
1.5 V ± 22 mV
1.6 V ± 22 mV
1.7 V ± 22 mV
1.8 V ± 22 mV
1.9 V ± 22 mV
2.0 V ± 22 mV
2.1 V ± 22 mV
2.2 V ± 1.0%
2.3 V ± 1.0%
2.4 V ± 1.0%
2.5 V ± 1.0%
2.6 V ± 1.0%
2.7 V ± 1.0%
2.8 V ± 1.0%
2.9 V ± 1.0%
3.0 V ± 1.0%
3.1 V ± 1.0%
3.2 V ± 1.0%
3.3 V ± 1.0%
3.4 V ± 1.0%
3.5 V ± 1.0%
3.6 V ± 1.0%
3.7 V ± 1.0%
3.8 V ± 1.0%
3.9 V ± 1.0%
4.0 V ± 1.0%
4.1 V ± 1.0%
4.2 V ± 1.0%
4.3 V ± 1.0%
4.4 V ± 1.0%
4.5 V ± 1.0%
4.6 V ± 1.0%
4.7 V ± 1.0%
4.8 V ± 1.0%
4.9 V ± 1.0%
5.0 V ± 1.0%
Table 5
SOT-23-5
S-1004CA10I-M5T1U
S-1004CA11I-M5T1U
S-1004CA12I-M5T1U
S-1004CA13I-M5T1U
S-1004CA14I-M5T1U
S-1004CA15I-M5T1U
S-1004CA16I-M5T1U
S-1004CA17I-M5T1U
S-1004CA18I-M5T1U
S-1004CA19I-M5T1U
S-1004CA20I-M5T1U
S-1004CA21I-M5T1U
S-1004CA22I-M5T1U
S-1004CA23I-M5T1U
S-1004CA24I-M5T1U
S-1004CA25I-M5T1U
S-1004CA26I-M5T1U
S-1004CA27I-M5T1U
S-1004CA28I-M5T1U
S-1004CA29I-M5T1U
S-1004CA30I-M5T1U
S-1004CA31I-M5T1U
S-1004CA32I-M5T1U
S-1004CA33I-M5T1U
S-1004CA34I-M5T1U
S-1004CA35I-M5T1U
S-1004CA36I-M5T1U
S-1004CA37I-M5T1U
S-1004CA38I-M5T1U
S-1004CA39I-M5T1U
S-1004CA40I-M5T1U
S-1004CA41I-M5T1U
S-1004CA42I-M5T1U
S-1004CA43I-M5T1U
S-1004CA44I-M5T1U
S-1004CA45I-M5T1U
S-1004CA46I-M5T1U
S-1004CA47I-M5T1U
S-1004CA48I-M5T1U
S-1004CA49I-M5T1U
S-1004CA50I-M5T1U
SNT-6A
S-1004CA10I-I6T1U
S-1004CA11I-I6T1U
S-1004CA12I-I6T1U
S-1004CA13I-I6T1U
S-1004CA14I-I6T1U
S-1004CA15I-I6T1U
S-1004CA16I-I6T1U
S-1004CA17I-I6T1U
S-1004CA18I-I6T1U
S-1004CA19I-I6T1U
S-1004CA20I-I6T1U
S-1004CA21I-I6T1U
S-1004CA22I-I6T1U
S-1004CA23I-I6T1U
S-1004CA24I-I6T1U
S-1004CA25I-I6T1U
S-1004CA26I-I6T1U
S-1004CA27I-I6T1U
S-1004CA28I-I6T1U
S-1004CA29I-I6T1U
S-1004CA30I-I6T1U
S-1004CA31I-I6T1U
S-1004CA32I-I6T1U
S-1004CA33I-I6T1U
S-1004CA34I-I6T1U
S-1004CA35I-I6T1U
S-1004CA36I-I6T1U
S-1004CA37I-I6T1U
S-1004CA38I-I6T1U
S-1004CA39I-I6T1U
S-1004CA40I-I6T1U
S-1004CA41I-I6T1U
S-1004CA42I-I6T1U
S-1004CA43I-I6T1U
S-1004CA44I-I6T1U
S-1004CA45I-I6T1U
S-1004CA46I-I6T1U
S-1004CA47I-I6T1U
S-1004CA48I-I6T1U
S-1004CA49I-I6T1U
S-1004CA50I-I6T1U
6 Seiko Instruments Inc.
6 Page BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN
S-1004 Series
Rev.2.1_00
Test Circuits
VDD
VDD
R
100 kΩ
VDD
VDD
SENSE OUT
SENSE OUT
+
V
VSS CD
+
V
+
V
VSS CD
+
V
Figure 7 Test Circuit 1
(Nch open-drain output product)
+A
VDD
+
A
VDD
SENSE OUT
VSS CD
Figure 8 Test Circuit 1
(CMOS output product)
VDD
VDD +
V SENSE OUT
VSS CD
+
A
+
V
VDS
Figure 9 Test Circuit 2
Figure 10 Test Circuit 3
VDD
P.G.
VDD
SENSE OUT
VSS CD
R
470 kΩ or 100 kΩ
Oscilloscope
VDD
P.G.
VDD
SENSE OUT
VSS CD
Oscilloscope
Figure 11 Test Circuit 4
(Nch open-drain output product)
VDD
VDD
+
V SENSE OUT
VSS CD
+
V
+
A
VDS
Figure 12 Test Circuit 4
(CMOS output product)
Figure 13 Test Circuit 5
12 Seiko Instruments Inc.
12 Page | ||
Seiten | Gesamt 30 Seiten | |
PDF Download | [ S-1004 Schematic.PDF ] |
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