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CHPHR0603 Schematic ( PDF Datasheet ) - Vishay

Teilenummer CHPHR0603
Beschreibung Thick Film Resistor Chips
Hersteller Vishay
Logo Vishay Logo 




Gesamt 7 Seiten
CHPHR0603 Datasheet, Funktion
www.vishay.com
CHPHR
Vishay Sfernice
ESCC 4001/026 Qualified ( ) High Stability
Thick Film Resistor Chips
Vishay Sfernice thick film chip resistors CHPHR are
specially designed to meet the requirements of the
ESA 4001/026 specification. They have undergone the
CNES evaluation (Space French National Agency). They are
in level 1 of the ESA EPPL (European Preferred Part List) and
ESA qualification is on-going.
DIMENSIONS in millimeters
A
DD
FEATURES
• SMD wraparound chip resistor
• Generic specification ESCC 4001
• Detailed specification ESCC 4001/026
• Robust terminations
• Large ohmic value range 1 to 10 M
• HCHP option 0.55: For high frequency applications
(up to 10 GHz)
• ESA ( ) qualified
• Material categorization: for definitions of compliance
please see www.vishay.com/doc?99912
Sputtered Thin Film terminations, with nickel barrier, are
very convenient for high operating conditions. They can
withstand thousands of very severe thermal shocks.
B (W/A) type is for solder reflow assembly (variant 01 to 05)
G (W/A) type is for gluing (variant 06 to 10)
CB
EE
VARIANT
NUMBER
STYLE
A
MIN.
MAX.
DIMENSIONS in millimeters
BCD
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
E
MIN.
MAX.
01, 06
02, 07
03, 08
0603
0805 (1)
1206
1.36
1.75
2.89
1.68
2.07
3.21
0.72
1.14
1.47
0.98
1.4
1.73
0.38
0.38
0.38
0.53
0.53
0.53
0.17
0.17
0.17
0.51
0.51
0.51
0.25
0.25
0.25
0.51
0.51
0.51
04, 09 2010 4.92 5.24 2.41 2.67 0.5 0.63 0.25 0.64 0.25 0.64
05, 10 2512 6.19 6.51 2.93 3.32 0.5 0.63 0.25 0.64 0.25 0.64
Note
(1) Model CHPHR0805 being same size than case 0705 with same performances, only codification of CHPHR0805 remains.
MECHANICAL SPECIFICATIONS
POWER DERATING CURVE
Substrate
Technology
Alumina
Thick film (Ruthenium oxyde)
100
Protection
Terminations
Epoxy coating
B (W/A): SnPb over nickel
barrier for
solder reflow
G (W/A) type: Gold over nickel
barrier
for gluing
CHIPS FOR HIGH FREQUENCY APPLICATIONS
High frequency option available up to 10 GHz
3 sizes: 0603, 0805, 1206
80
60
40
20
0
0 20 40 60 70 80 100 120 140 155
Ambient Temperature in °C
Revision: 19-Nov-14
1 Document Number: 52026
For technical questions, contact: [email protected]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000






CHPHR0603 Datasheet, Funktion
www.vishay.com
CHPHR
Vishay Sfernice
TRACEABILITY DEFINITIONS
The two major traceability elements are defined as:
• The primary process lot number named Front End lot (FE lot). One “FE lot”is composed of several wafers issued from the
same thin film deposition sequence.
• The date code named Batch Number(BN). The “BN” is defined after completion of the end of production testing sequence.
The lot homogeneity is given by the “FE lot” and not by the “BN”.
According to the applied rules validated by the ESCC through the product qualification, the following situations are agreed:
• Parts coming from different “FE lost” might have the same “BN”.
• A maximum of two different “BN” might be applied to the same “FE lot” to enable the use of overruns from a previous PO.
• Unless requested / approved by the customer the “BN” will be 2 years old maximum.
SPECIFIC TRACEABILITY REQUIREMENTS
The following specific requirements have to be treated as:
• A customer who requires “Lot Homogeneity” has to mention it on the PO as “SINGLE PRODUCTION LOT”.
• A customer who requires “Lot Homogeneity” in addition to a “Single Batch Number” has to mention it on the PO as “SINGLE
PRODUCTION LOT AND OPTION R0101”.
END OF PRODUCTION TESTING
Mandatory testing performed at the end of the production process:
• 100 % overload: Voltage 6.25 Pn x Rnor 2 UL whichever is less - duration 2 s
• 100 % burn in: 168 h at Pn at 70 °C
OPTIONS
LOT VALIDATION TESTING
For procurement of qualified components, lot validation
testing is not required and shall only be performed if
specifically stipulated in the purchase order.
For procurement of unqualified components, lot validation
testing shall be performed as stipulated in the purchase
order. The need for lot validation testing shall be determined
by the orderer.
When lot validation testing is required, it shall consist of the
performance of one or more of the tests or subgroup test
sequences of chart F4 indicated in the ESA generic
specification ESCC 4001. The testing to be performed and
the sample size shall be as stipulated in the purchase order.
When procurement of more than one component type is
involved from a family, range or series, the selection of
representative samples shall also be stipulated in the
purchase order.
Lot validation testing will be composed of one LVT charges
and LVT samples:
Lot validation test charges has to be ordered separately on
purchase order.
Lot validation samples have to be ordered separately on
purchase order.
FINAL INSPECTION
If requested by the orderer a final inspection can be
performed on site.
Final inspection has to be stipulated separately on purchase
order.
Revision: 19-Nov-14
6 Document Number: 52026
For technical questions, contact: [email protected]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000

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