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PDF A1361 Data sheet ( Hoja de datos )

Número de pieza A1361
Descripción Low-Noise Programmable Linear Hall Effect Sensor ICs
Fabricantes Allegro 
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A1360, A1361, and A1362
Low-Noise Programmable Linear Hall Effect Sensor ICs with
Adjustable Bandwidth (50 kHz Maximum) and Analog Output
Features and Benefits
1 mm case thickness provides greater coupling for current
sensing applications
Customer programmable offset and sensitivity
Factory programmed 0% / °C sensitivity temperature coefficient
Programmability at end-of-line
Selectable unipolar or bipolar quiescent voltage levels
Selectable sensitivity ranges between 0.7 and 1.4 mV/G (A1360),
1.4 to 4.5 mV/G (A1361) and 4.5 to 16 mV/G (A1362)
Device bandwidth selectable under 50 kHz, via capacitor on
FILTER pin
Ratiometric sensitivity, quiescent voltage output, and clamps for
interfacing with application DAC
Temperature-stable quiescent voltage output and sensitivity
Precise recoverability after temperature cycling
Output voltage clamps provide short circuit diagnostic capabilities
Wide ambient temperature range: – 40°C to 150°C
Resistant to mechanical stress
Package: 4 pin SIP (suffix KT)
1 mm case thickness
Not to scale
Description
New applications for linear output Hall effect sensing, such
as current measurement, require both high accuracy and
increased sensor bandwidth. The Allegro® A1360, A1361,
and A1362 programmable linear Hall effect sensor ICs are
designed specifically to achieve both goals. Available in a
through-hole SIP (single in-line package), the A136x Hall
effect sensor ICs are sensitive and temperature-stable. The
accuracy of these devices is enhanced via programmability on
the device VOUT pin. A capacitor to ground on the FILTER
pin on the A136x can be used to tune the device bandwidth in
a range less than 50 kHz.
These ratiometric Hall effect sensor ICs provide a voltage
output that is proportional to the applied magnetic field. The
quiescent output voltage is user-adjustable around either
50% (bidirectional configuration) or 10% (unidirectional
configuration) of the supply voltage,VCC.The device sensitivity
is adjustable within three guaranteed ranges: 0.7 to 1.4 mV/G
(A1360), 1.4 to 4.5 mV/G (A1361), and 4.5 to 16 mV/G
(A1362).
Each BiCMOS monolithic circuit integrates a Hall element,
temperature-compensation circuitry to reduce the intrinsic
sensitivity drift of the Hall element, a small-signal high-gain
amplifier, a clamped low-impedance output stage, and a
proprietary dynamic offset cancellation technique.
Continued on the next page…
V+
VCC
Ratiometric
Hall Drive
C.BYPASS
Functional Block Diagram
Sensitivity
Program/Lock
Trim Control
Sensitivity
Temperature
Coefficient
Offset
To subcircuits
Signal Recovery
+
+
FILTER
VOUT
(Programming)
A1360-DS, Rev. 3
GND

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A1361 pdf
A1360, A1361, Low-Noise Programmable Linear Hall Effect Sensor ICs with
and A1362
Adjustable Bandwidth (50 kHz Maximum) and Analog Output
OPERATING CHARACTERISTICS (continued) valid over full operating temperature range, TA; CBYPASS = 0.1 μF, VCC = 5 V, unless otherwise specied
Characteristic
Symbol
Test Conditions
Min.
Typ.
Max.
Units
Drift Characteristics
A1360
–20 –
20 mV
Quiescent Voltage Output Drift
Through Temperature Range1
VOUT(Q)
A1361 VOUT(Q) = 2.5 V; Sens = Sens(min)
A1362
A1360
–20
–60
– 35
20 mV
60 mV
35 mV
A1361 VOUT(Q) = 2.5 V; Sens = Sens(max)
A1362
–50
–160
50 mV
160 mV
Sensitivity Drift Due to Package
Hysteresis1
SensPKG TA = 25°C, after temperature cycling
– < ±1 – %
1 See Characteristic Definitions section.
2 fC varies up to approximately ±20% over the full operating ambient temperature range, TA, and process.
3 VCLP voltages are production-tested, with the sole exception of the A1360 VCLP(HIGH), which is guaranteed by design (the low sensitivity and corresponding high
gauss levels required for testing A1360 VCLP(HIGH) make production testing impractical).
4 Noise is dependent on the sensitivity of the device and the filter capacitance. An 8 mV peak-to-peak noise floor exists that is independent of device sensitivity. This noise
floor attenuates proportionate to the filter capacitance (and device bandwidth).
5 Unit of measure (phase degrees) in reference to the magnetic input signal.
6 High-to-low transition of output voltage is a function of external load components and device sensitivity.
7 Raw device characteristic values before any programming.
8 VOUT(Q)UNIinit typically starts below the lower clamp voltage, VCLP(LOW). When programming the fine quiescent duty cycle for this parameter, several codes may need to be
addressed before VOUT(Q)UNI can be measured above VCLP(LOW).
9 Bits for selecting between VOUT(Q)UNI and VOUT(Q)BI programming ranges.
10 VOUT(Q) guaranteed by design.
11 VOUT(Q)(max) is the value available with all programming fuses blown (maximum programming code set). The VOUT(Q) range is the total range from VOUT(Q)init up to and
including VOUT(Q)(max). See Characteristic Definitions section. Quiescent Voltage Output may drift by an additional ±10 mV over the lifetime of this product.
12 Step size is larger than required, in order to provide for manufacturing spread. See Characteristic Definitions section.
13 Non-ideal behavior in the programming DAC can cause the step size at each significant bit rollover code to be greater than twice the maximum specified value of
StepVOUT(Q) or StepSENS.
14 Overall programming value accuracy. See Characteristic Definitions section.
15 Sens guaranteed by design.
16 Sens(max) is the value available with all programming fuses blown (maximum programming code set). Sens range is the total range from Sensinit up to and including
Sens(max). See Characteristic Definitions section. Sensitivity may drift by an additional ±2% over the lifetime of this product.
17 Programmed at 150°C and calculated relative to 25°C.
18 Linearity is only guaranteed for output voltage ranges of ±2 V from the quiescent output for bidirectional devices and +2 V from the quiescent output for unidirectional
devices. These linearity ranges are only valid within the operating output range of the device. The operating output range is confined to the region between the output clamps.
Linearity may shift by up to +/- 1 % over the lifetime of this product.
19 Symmetry error is only valid for bidirectional devices. Symmetry may shift by up to ±1% over the lifetime of this product.
20 Percent change from actual value at VCC = 5 V, for a given temperature, over the guaranteed supply voltage operating range.
21 Percent change from actual value at VCC = 5 V, TA = 25°C, over the guaranteed supply voltage operating range.
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
5

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A1361 arduino
A1360, A1361, Low-Noise Programmable Linear Hall Effect Sensor ICs with
and A1362
Adjustable Bandwidth (50 kHz Maximum) and Analog Output
Guaranteed Sensitivity Range The magnetic sensitivity, Sens,
can be programmed around its nominal value, 0.7 to 16 mV/G
depending on device type, within the sensitivity range limits:
Sens(min) and Sens(max). Refer to the Guaranteed Quiescent
Voltage Output Range section for a conceptual explanation of
how value distributions and ranges are related.
Average Sensitivity Step Size Refer to the Average Quiescent
Voltage Output Step Size section for a conceptual explanation.
Sensitivity Programming Resolution Refer to the Quiescent
Voltage Output Programming Resolution section for a conceptual
explanation.
Sensitivity Temperature Coefficient Device sensitivity changes
as temperature changes, with respect to its programmed sensitiv-
ity temperature coefficient, TCSENS. TCSENS is programmed at
150°C, and calculated relative to the nominal sensitivity program-
ming temperature of 25°C. TCSENS (%/°C) is defined as:
TCSens
=
⎜⎜⎝⎛SensSTe2nsTS1ensT1
×
100%⎟⎟
⎜⎜⎝⎛T21–T1⎟⎟⎠⎞
,
(6)
where T1 is the nominal Sens programming temperature of 25°C,
and T2 is the TCSENS programming temperature of 150°C. The
ideal value of Sens over the full ambient temperature range,
SensEXPECTED(TA), is defined as:
SensEXPECTED(TA) = SensT1 [1 + TCSENS (TA T1) / 100%] (7)
SensEXPECTED(TA) should be calculated using the actual measured
values of SensT1 and TCSENS rather than programming target
values.
Sensitivity Drift Due to Package Hysteresis Package stress and
relaxation can cause the device sensitivity at TA = 25°C to change
during and after temperature cycling.
where Sens(25°C)1 is the programmed value of sensitiv-
ity at TA = 25°C, and Sens(25°C)2 is the value of sensitivity at
TA = 25°C, after temperature cycling TA up to 150°C, down to
–40°C, and back to up 25°C.
Linearity Sensitivity Error The 136x family is designed to
provide a linear output in response to a ramping applied magnetic
field. Consider two magnetic fields, B1 and B2. Ideally, the sen-
sitivity of a device is the same for both fields, for a given supply
voltage and temperature. Linearity error is present when there is a
difference between the sensitivities measured at B1 and B2.
Linearity Error is calculated separately for the positive
(LinERRPOS) and negative (LinERRNEG) applied magnetic fields.
Linearity error (%) is measured and defined as:
LinERRPOS
=
⎜⎜1–
SensBPOS2
SensBPOS1
⎟⎟
×100%
,
LinERRNEG
=
⎜⎜1–
SSeennssBBNNEEGG12⎟⎟⎠⎞
×100%
,
(9)
where:
SensBx
=
|VOUT(Bx)
Bx
VOUT(Q)|
,
(10)
and BPOSx and BNEGx are positive and negative magnetic fields,
with respect to the quiescent voltage output such that
|BPOS2| = 2 ×|BPOS1| and |BNEG2| = 2 ×|BNEG1|. Then:
For purposes of specification, the sensitivity drift due to package
hysteresis, SensPKG, is defined as:
SensPKG =
Sens(25°C)2 Sens(25°C)1
Sens(25°C)1
×
100%
,
(8)
LinERR = max( LinERRPOS , LinERRNEG) .
(11)
Note that unipolar devices only have positive linearity error,
LinERRPOS.
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
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