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ELIS-1024A-D-ES Schematic ( PDF Datasheet ) - Panavision Imaging

Teilenummer ELIS-1024A-D-ES
Beschreibung High Performance Linear Image Sensors
Hersteller Panavision Imaging
Logo Panavision Imaging Logo 




Gesamt 13 Seiten
ELIS-1024A-D-ES Datasheet, Funktion
ONE TE C H N O L O G Y PLACE – HOMER, NEW YORK 13077
TEL: +1 607 749 2000 FAX: +1 607 749 3295 www.PanavisionImaging.com / [email protected]
High Performance Linear Image Sensors
ELIS-1024 IMAGER
The Panavision Imaging ELIS is a high performance linear image sensor designed to replace CCD’s in a wide
variety of applications, including:
Edge Detection
Contact Imaging
Bar Code Reading
Finger Printing
Encoding and Positioning
Text Scanning
P/N: ELIS-1024A-LG
16-pin LCC package
P/N: ELIS-1024A-D-ES
16-pin ceramic DIP package
P/N: ELIS-1024A-CP-ES
CSP package (µBGA)
Description
The ELIS-1024 Linear Image Sensor consists of an array of high performance, low dark current photo-diode
pixels. The sensor features sample and hold capability, selectable resolution and advanced power
management. The device can operate at voltages as low as 2.8V making it ideal for portable applications. A
key feature over traditional CCD technology is that the device can be read and reread Non-Destructively,
allowing the user to maximize signal to noise and dynamic range. Internal logic automatically reduces power
consumption when lower resolution settings are selected. A low power standby mode is also available to
reduce system power consumption when the imager is not in use. Available in a low cost SMT package as
well as a high performance dual inline ceramic package.
Key Features
Low Cost
Single Voltage Operation, Wide Operating Range
Selectable Resolutions of 1024, 512, 256 and 128 pixels
Intelligent Power Management and Low-Power Standby Mode
Sample and Hold
Full Frame Shutter and Dynamic Pixel Reset (DPR) Modes
High Sensitivity
High Signal to Noise
Non-Destructive Read Capable, extremely low noise capable via signal averaging
1.0 kHz to 30.0 MHz Operation
Very Low Dark Current
Completely Integrated Timing and Control
Replaces Entire CCD Systems, Not Just the Sensor
PDS0004 REV J 04/14/09
© Panavision Imaging LLC 2004- 2009 All rights reserved.
Subject to change without notice.
Page 1 of 13






ELIS-1024A-D-ES Datasheet, Funktion
Frame Mode Timing (RM = 0)
In Frame Mode three signals are required for operation not including resolution selection and CLK.
These being reset (RST), shutter (SHT) and start data readout (DATA). Both RST and SHT are
asynchronous to the system clock, which allows unlimited reset and integration timing resolution.
Standard Timing
The timing relations for Standard Timing are shown in Figure 1 and detailed descriptions are given
below. In the VIDEO waveform the ‘X Clock Cycles’ is determined by the resolution selected. The
clock should be 50% duty cycle.
CLK
RST
SHT
DATA
VIDEO
t RST
t int
Figure 1: Start of Frame Timing Diagram.
Video_Out
X Clock Cycles
Device Reset:
The pixels are simultaneously reset while the RST and SHT inputs are both held high for at least
200ns, as indicated by tRST. The imager can be held in reset indefinitely by keeping both inputs high.
When RST is high the internal clocks to the shift register are disabled and the shift register is held in
reset. Once RST goes low the shift register comes out of reset and the clocks begin running.
Integration:
Once RST goes low (while SHT is high), the pixels begin to integrate. Integration continues until
SHT goes low as indicated by tint.
Readout:
Readout will begin on the first rising edge of CLK after the DATA input is set high. DATA must be
brought low prior to the next rising edge of CLK, otherwise pixel 1 is again output along with pixel 2.
See Figure 2 for details. The RST pulse always resets the internal shift register, thus the next pixel to
be readout after the first rising edge of CLK when DATA is asserted is the first pixel. The timing
details of the DATA pulse are shown below, tD = 10ns.
CLK
DATA
tD tD tD
Figure 2: Detailed DATA Pulse Timing Diagram.
tD
PDS0004 REV J 04/14/09
© Panavision Imaging LLC 2004- 2009 All rights reserved.
Subject to change without notice.
Page 6 of 13

6 Page









ELIS-1024A-D-ES pdf, datenblatt
ORDERING INFORMATION
These devices are offered in several packaging options
as follows;
ELIS-1024A-LG Leadless Chip Carrier (LCC).
ELIS-1024A-D-LG-ES 16 pin ceramic dual inline
package (DIP) without window.
ELIS-1024A-CP-ES – Chip Scale Package (µBGA)
ELIS-1024A-G – Known Good die on wafer
Note: ES designates Engineering Sample Grade
Contact Panavision Imaging, LLC or your local
authorized representative for pricing and availability.
Characterization Criteria
Characterization measurements are guaranteed by
design and are not tested for production parts. Unless
otherwise specified, the measurements described herein
are characterization measurements.
Pixel Clock Frequency
The pixel clock frequency is the frequency at which
adjacent pixels can be reliably read.
Full Well
Full well (or Saturation Exposure) is the maximum
number of photon-generated and/or dark current-
generated electrons a pixel can hold. Full well is based
on the capacitance of the pixel at a given bias. Full well
is determined by measuring the capacitance of all pixels
for the operational bias. In reality, the pixel analog
circuitry will limit the signal swing on the pixel, so full
well is defined as the number of electrons that will
bring the output to the specified saturation voltage.
Quantum Efficiency
Quantum Efficiency is a measurement of the pixel
ability to capture photon-generated charge as a function
of wavelength. This is measured at 10nm increments
over the wavelength range of the sensor typically over
the range 300 to 1100 nm. Measurements are taken
using a stable light source that is filtered using a
monochromator. The exiting light from the
monochromator is collimated to provide a uniform flux
that overfills a portion of the sensor area. The flux at a
given wavelength is measured using a calibrated
radiometer and then the device under test is substituted
and its response measured.
Linearity
Linearity is an equal corresponding output signal of the
sensor for a given amount of photons incident on the
pixel active area. Linearity is measured by plotting the
imager transfer function from dark to saturation and
fitting a ‘best fit’ straight line from 5% to 75% of
saturation. The maximum peak-peak deviation of the
output voltage from the ‘best fit’ straight line is
computed (Epp) over the fitting range. Linearity (L) is
then computed as shown below where VFS is the full-
scale voltage swing from dark to saturation measured
with sensor gain at 0.0 dB.
L
=
1
E
pp
VFS

×100%
Average Dark Offset
The ‘dark offset’ is the voltage proportional to the
accumulated electrons for a given integration period,
that were not photon generated i.e. dark current. There
are a few sources in CMOS circuits for the dark current
and the dark current levels will vary even for a given
process. Dark offset is measured as the delta in output
voltage from integration time 0 sec. to 1.0 sec with no
light at TA = 24°C.
Read Noise
Read noise is the temporal or time variant noise in the
analog signal due to thermal noise in the analog path.
Read noise does not include spatial noise such as fixed
pattern noise (FPN). Read noise is measured at the
output of the imager with proper loading and bandwidth
filtering at 50% saturation and is calculated using the
following;
TemporalRMSnoise =
1
1024
1024
i=1
σ
2
i
Image Lag
Image lag is the amount of residual signal in terms of
percent of full well on the current frame of video after
injecting the previous frame of video. Image lag is
measured by illuminating an ROI to 50% of saturation
for one frame and then rereading those pixels for the
next and subsequent frames without light exposure.
Any remaining residual signal will be measured and
recorded in terms of percent of full well.
Dynamic Range
Dynamic range is determined by dividing the full-scale
output voltage swing by the root mean squared (rms)
temporal read noise voltage and expressed as a ratio or
in decibels.
DR
=
20 logVFS
en 
PDS0004 REV J 04/14/09
© Panavision Imaging LLC 2004- 2009 All rights reserved.
Subject to change without notice.
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