PDF ADIS16400 Data sheet ( Hoja de datos )

Número de pieza	ADIS16400
Descripción	High Precision Tri-Axis Inertial Sensor
Fabricantes	Analog Devices
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No Preview Available ! www.daFtaEsAhTeeUt4RuE.cSom Triaxial, digital gyroscope with digital range scaling ±75°/sec, ±150°/sec, ±300°/sec settings Triaxial, ±18 g digital accelerometer Triaxial, ±2.5 gauss digital magnetometer 220 ms start-up time Factory-calibrated sensitivity, bias, and axial alignment ADIS16400 calibration temperature: +25°C ADIS16405 calibration temperature range: −40°C to +85°C Digitally controlled bias calibration Digitally controlled sample rate, up to 819.2 SPS External clock input enables sample rates up to 1200 SPS Digitally controlled filtering Programmable condition monitoring Auxiliary digital input/output Digitally activated self-test Programmable power management Embedded temperature sensor SPI-compatible serial interface Auxiliary, 12-bit ADC input and DAC output Single-supply operation: 4.75 V to 5.25 V 2000 g shock survivability Operating temperature range: −40°C to +105°C APPLICATIONS Unmanned aerial vehicles Platform control Digital compassing Navigation GENERAL DESCRIPTION The ADIS16400/ADIS16405 iSensor® products are complete inertial systems that include a triaxal gyroscope, a triaxial accelerometer, and a triaxial magnetometer. The ADIS16400/ ADIS16405 combine industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation for correction formulas that provide accurate sensor measurements over a temperature range of −40°C to +85°C. The magnetometers employ a self-correction function to provide accurate bias performance over temperature, as well. The ADIS16400/ADIS16405 provide a simple, cost-effective method for integrating accurate, multi-axis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All Rev. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners. Triaxial Inertial Sensor with Magnetometer ADIS16400/ADIS16405 FUNCTIONAL BLOCK DIAGRAM AUX_ ADC AUX_ DAC TEMPERATURE SENSOR TRI-AXIS MEMS ANGULAR RATE SENSOR SIGNAL CONDITIONING AND CONVERSION CALIBRATION AND DIGITAL PROCESSING OUTPUT REGISTERS AND SPI INTERFACE TRI-AXIS MEMS ACCELERATION SENSOR CS SCLK DIN DOUT TRI-AXIS MAGNETIC SENSOR ALARMS POWER MANAGEMENT SELF-TEST ADIS16405 DIGITAL CONTROL RST DIO1 DIO2 DIO3 DIO4/ CLKIN Figure 1. VCC GND necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. An improved serial peripheral interface (SPI) and register structure provide faster data collection and configuration control. By using a compatible pinout and the same package as the ADIS1635x and ADIS1636x families, upgrading to the ADIS16400/ADIS16405 requires only firmware changes to accommodate additional sensors and register map updates. These compact modules are approximately 23 mm × 23 mm × 23 mm and provide a flexible connector interface that enables multiple mounting orientation options. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2009 Analog Devices, Inc. All rights reserved. 1 page ADIS16400/ADIS16405 Parameter POWER SUPPLY Operating Voltage Range, VCC Power Supply Current www.datasheet4u.com Test Conditions Low power mode at 25°C Normal mode at 25°C Sleep mode at 25°C Min Typ Max Unit 4.75 5.0 45 70 600 5.25 V mA mA μA 1 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 2 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 3 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction temperature. 4 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy. Rev. A \| Page 5 of 20 5 Page ADIS16400/ADIS16405 MEMORY MAP Table 8. User Register Memory Map Name R/W Flash Backup FLASH_CNT R Yes www.daStUasPhPeLeYt_4Ou.UcTom R XGYRO_OUT R No No YGYRO_OUT R No ZGYRO_OUT R No XACCL_OUT R No YACCL_OUT R No ZACCL_OUT R No XMAGN_OUT R No YMAGN_OUT R No ZMAGN_OUT R No TEMP_OUT R No AUX_ADC R No XGYRO_OFF R/W Yes YGYRO_OFF R/W Yes ZGYRO_OFF R/W Yes XACCL_OFF R/W Yes YACCL_OFF R/W Yes ZACCL_OFF R/W Yes XMAGN_HIF R/W Yes YMAGN_HIF R/W Yes ZMAGN_HIF R/W Yes XMAGN_SIF R/W Yes YMAGN_SIF R/W Yes ZMAGN_SIF R/W Yes GPIO_CTRL R/W No MSC_CTRL R/W Yes SMPL_PRD R/W Yes SENS_AVG R/W Yes SLP_CNT W No DIAG_STAT R No GLOB_CMD W N/A ALM_MAG1 R/W Yes ALM_MAG2 R/W Yes ALM_SMPL1 R/W Yes ALM_SMPL2 R/W Yes ALM_CTRL R/W Yes AUX_DAC R/W No Address1 0x00 0x02 0x04 0x06 0x08 0x0A 0x0C 0x0E 0x10 0x12 0x14 0x16 0x18 0x1A 0x1C 0x1E 0x20 0x22 0x24 0x26 0x28 0x2A 0x2C 0x2E 0x30 0x32 0x34 0x36 0x38 0x3A 0x3C 0x3E 0x40 0x42 0x44 0x46 0x48 0x4A Default N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A N/A 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0006 0x0001 0x0402 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 0x0000 Function Flash memory write count Power supply measurement X-axis gyroscope output Y-axis gyroscope output Z-axis gyroscope output X-axis accelerometer output Y-axis accelerometer output Z-axis accelerometer output X-axis magnetometer measurement Y-axis magnetometer measurement Z-axis magnetometer measurement Temperature output Auxiliary ADC measurement X-axis gyroscope bias offset factor Y-axis gyroscope bias offset factor Z-axis gyroscope bias offset factor X-axis acceleration bias offset factor Y-axis acceleration bias offset factor Z-axis acceleration bias offset factor X-axis magnetometer, hard-iron factor Y-axis magnetometer, hard-iron factor Z-axis magnetometer, hard-iron factor X-axis magnetometer, soft-iron factor Y-axis magnetometer, soft-iron factor Z-axis magnetometer, soft-iron factor Auxiliary digital input/output control Miscellaneous control Internal sample period (rate) control Dynamic range and digital filter control Sleep mode control System status System command Alarm 1 amplitude threshold Alarm 2 amplitude threshold Alarm 1 sample size Alarm 2 sample size Alarm control Auxiliary DAC data Bit Assignments N/A See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 9 See Table 10 See Table 10 See Table 10 See Table 11 See Table 11 See Table 11 See Table 12 See Table 12 See Table 12 See Table 13 See Table 13 See Table 13 See Table 18 See Table 19 See Table 15 See Table 17 See Table 16 See Table 23 See Table 14 See Table 25 See Table 25 See Table 26 See Table 26 See Table 24 See Table 20 1 Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1. CS SCLK DIN DOUT R/W A6 A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 NOTES 1. DOUT BITS ARE BASED ON THE PREVIOUS 16-BIT SEQUENCE (R = 0). Figure 11. Output Register Bit Assignments R/W A6 A5 D15 D14 D13 Rev. A \| Page 11 of 20 11 Page

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