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PDF ADIS16365 Data sheet ( Hoja de datos )

Número de pieza ADIS16365
Descripción Tri-Axis Inertial Sensor
Fabricantes Analog Devices 
Logotipo Analog Devices Logotipo



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No Preview Available ! ADIS16365 Hoja de datos, Descripción, Manual

Preliminary Technical Data
www.daFtaEsAhTeeUt4RuE.cSom
Tri-axis gyroscope with digital range scaling
±75°/sec, ±150°/sec, ±300°/sec settings
14-bit resolution
Tri-axis accelerometer
±17 g measurement range
14-bit resolution
350 Hz bandwidth
Factory calibrated sensitivity, bias, and alignment
Calibration temperature range: −40°C to +85°C
External clock input for sample synchronization
Digitally controlled bias calibration
Digitally controlled sample rate
Digitally controlled filtering
Programmable condition monitoring
Auxiliary digital input/output
Digitally activated self-test
Programmable power management
Embedded temperature sensor
SPI-compatible serial interface
Auxiliary 12-bit ADC input and DAC output
Single-supply operation: 4.75 V to 5.25 V
2000 g shock survivability
Operating temperature range: −40°C to +105°C
APPLICATIONS
Guidance and control
Platform control and stabilization
Motion control and analysis
Inertial measurement units
General navigation
Image stabilization
Robotics
GENERAL DESCRIPTION
The ADIS16365 iSensor® is a complete triple axis gyroscope and
triple axis accelerometer inertial sensing system. This sensor
combines the Analog Devices, Inc., iMEMS® and mixed signal
processing technology to produce a highly integrated solution
that provides calibrated, digital inertial sensing. An SPI
interface and simple output register structure allow for easy
access to data and configuration controls.
The SPI port provides access to the following embedded sensors:
X-, Y-, and Z-axis angular rates; X-, Y-, and Z-axis linear accelera-
tion; internal temperature; power supply; and auxiliary analog
input. The inertial sensors are precision-aligned across axes and
Rev. PrA
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
Tri-Axis Inertial Sensor
ADIS16365
FUNCTIONAL BLOCK DIAGRAM
AUX_ADC AUX_DAC
TEMPERATURE
SENSORS
TRI-AXIS MEMS
ANGULAR
RATE SENSOR
ADIS16365
ALARMS
SIGNAL
CONDITIONING
AND
CONVERSION
CALIBRATION
AND
DIGITAL
PROCESSING
SPI
PORT
TRI-AXIS MEMS
ACCELERATION
SENSOR
DIGITAL
CONTROL
POWER
MANAGEMENT
CS
SCLK
DIN
DOUT
VCC
GND
SELF-TEST
RST DIO1 DIO2 DIO3 DIO4/
CLKIN
Figure 1.
are calibrated for offset and sensitivity over the industrial
temperature range of −40 to +85°C. An embedded controller
dynamically compensates for all major influences on the
sensors, thus maintaining highly accurate sensor outputs
without further testing, circuitry, or user intervention.
The following programmable features simplify system integra-
tion: in-system autobias calibration, digital filtering and sample
rate, self-test, power management, condition monitoring, and
auxiliary digital input/output.
This compact module is approximately 23 mm × 23 mm ×
23 mm and provides a convenient flex-based connector system.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2008 Analog Devices, Inc. All rights reserved.

1 page




ADIS16365 pdf
Preliminary Technical Data
ADIS16365
Parameter
POWER SUPPLY
Operating Voltage Range, VCC
Power Supply Current
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Conditions
Low power mode at 25°C
Fast mode at 25°C
Sleep mode at 25°C
Min Typ Max Unit
4.75 5.0 5.25 V
24 mA
49 mA
500 μA
1 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
2 Guaranteed by design.
3 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
3 Retention lifetime equivalent at junction temperature (TJ) 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.
5 The times presented in this section do not include the sensor’s transient response time, which is associated with a 50 Hz single-pole system. System accuracy goals
should be given consideration when determining the amount of time it takes to start acquiring accurate readings. These times do not include the time it takes to
arrive at thermal stability, which can also introduce transient errors.
Rev. PrA | Page 5 of 20

5 Page





ADIS16365 arduino
Preliminary Technical Data
ADIS16365
DEVICE CONFIGURATION
BURST MODE DATA COLLECTION
The ADIS16365 SPI provides device configuration control as
well, eight bits at a time. Each function has a configurable
register, which governs its operation, as listed in Table 7. In
Figure 3, the first byte contains the write bit and register
w addwress. Forwexample,. the firstdbyte of aawrite to tthe SMPaL_PRD s
is 0x80 (write bit high) plus 0x36 (low-byte address), which is
0xB6. The second byte of the DIN sequence contains the data,
which loads into the specified location. For the lowest sample
rate setting, 0xFF is the code. The entire DIN sequence for
setting the slowest sample rate is 0xB6FF.
Burst mode data collection offers a more process-efficient
method for collecting data from the ADIS16365. In 12 sequen-
tial data cycles, separated by only one SCLK time period, all 11-
output registers clock out on DOUT. In Figure 4, this sequence
shtarts wheen the DIeN sequentce is 0x34E00. Aftuer that, th.e
c
contents of each output register, comes out of DOUT, starting
with SUPPLY_OUT and ending with AUX_ADC. The
addressing sequence determines the order of the outputs in
burst mode.
Many of the configuration registers have also been assigned
mirror locations in the flash memory, which effectively provides
them with a backup storage function. To assure the backup of
these registers, the COMMAND register provides an initiation
bit for manual flash updates. The ENDURANCE register
provides a running count of these events.
Table 7. User Register Map
Name
R/W Flash Backup
ENDURANCE R
Yes
SUPPLY_OUT R
No
XGYRO_OUT R
No
YGYRO_OUT R
No
ZGYRO_OUT R
No
XACCL_OUT R
No
YACCL_OUT R
No
ZACCL_OUT R
No
XTEMP_OUT R
No
YTEMP_OUT R
No
ZTEMP_OUT R
No
AUX_ADC
R No
XGYRO_OFF
YGYRO_OFF
ZGYRO_OFF
XACCL_OFF
YACCL_OFF
ZACCL_OFF
ALM_MAG1
ALM_MAG2
ALM_SMPL1
ALM_SMPL2
ALM_CTRL
AUX_DAC
GPIO_CTRL
MSC_CTRL
SMPL_PRD
SENS/AVG
SLP_CNT
STATUS
COMMAND
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W Yes
R/W No
R/W No
R/W Yes
R/W Yes
R/W Yes
R/W No
R No
R/W N/A
Address
0x00
0x02
0x04
0x06
0x08
0x0A
0x0C
0x0E
0x10
0x12
0x14
0x16
0x18
0x1A
0x1C
0x1E
0x20
0x22
0x24
0x26
0x28
0x2A
0x2C
0x2E
0x30
0x32
0x34
0x36
0x38
0x3A
0x3C
0x3E
Size (Bytes)
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
Function
Flash memory write count
Power supply measurement
X-axis gyroscope output
Y-axis gyroscope output
Z-axis gyroscope output
X-axis accelerometer output
Y-axis accelerometer output
Z-axis accelerometer output
X-axis gyroscope temperature measurement
Y-axis gyroscope temperature measurement
Z-axis gyroscope temperature measurement
Auxiliary ADC output
Reserved
X-axis gyroscope bias offset factor
Y-axis gyroscope bias offset factor
Z-axis gyroscope bias offset factor
X-axis acceleration bias offset factor
Y-axis acceleration bias offset factor
Z-axis acceleration bias offset factor
Alarm 1 amplitude threshold
Alarm 2 amplitude threshold
Alarm 1 sample size
Alarm 2 sample size
Alarm control
Auxiliary DAC data
Auxiliary digital input/output control
Miscellaneous control
Internal sample period (rate) control
Dynamic range/digital filter control
Sleep mode control
System status
System command
Reference
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 8
Table 9
Table 9
Table 9
Table 10
Table 10
Table 10
Table 19
Table 19
Table 20
Table 20
Table 21
Table 16
Table 18
Table 17
Table 13
Table 15
Table 14
Table 22
Table 12
o
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