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PDF ADATE320 Data sheet ( Hoja de datos )
| Número de pieza | ADATE320 | |
| Descripción | 1.25 GHz Dual Integrated DCL | |
| Fabricantes | Analog Devices | |
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Data Sheet
1.25 GHz Dual Integrated DCL with PPMU, Level
Setting DACs, and On-Chip Calibration Registers
ADATE320
FEATURES
1.25 GHz, 2.5 Gbps data rate
3-level driver with high-Z and reflection clamps
Window and differential comparators
±25 mA active load
Per pin parametric measurement unit (PMU) with a −1.5 V to
+4.5 V range
Low leakage mode (typically <5 nA)
Integrated 16-bit DACs with offset and gain correction
1.2 W power dissipation per channel (ADATE320)
1.3 W power dissipation per channel (ADATE320-1)
Driver
Voltage range: −1.5 V to +4.5 V
Precision trimmed termination: 50.0 Ω
Unterminated swing: 50 mV minimum to 6.0 V maximum
400 ps minimum pulse width, 1.0 V programmed swing
25 ps deterministic jitter
Comparator
Differential and single-ended window modes
100 ps equivalent input rise/fall time (ERT/EFT)
250 mV current mode logic (CML) outputs (ADATE320)
400 mV CML outputs (ADATE320-1)
Load
Per pin PMU (PPMU)
Force voltage/compliance range: −1.5 V to +4.5 V
5 current ranges
±40 mA, ±1 mA, ±100 μA, ±10 µA, ±2 µA
Dedicated go/no-go comparators
DC levels
Fully integrated and dedicated 16-bit DACs
On-chip gain and offset calibration registers with
automatic add/multiply function
84-lead, 10 mm × 10 mm LFCSP (0.4 mm pitch)
APPLICATIONS
Automatic test equipment (ATE)
Semiconductor/board test systems
Instrumentation and characterization equipment
GENERAL DESCRIPTION
The ADATE320 is a complete, single-chip ATE solution that
performs the pin electronics functions of a driver, comparator,
and active load (DCL), and a four quadrant per pin parametric
measurement unit (PPMU). Dedicated 16-bit digital-to-analog
converters (DACs) with on-chip calibration registers provide all
the necessary dc levels for operation of the device.
The driver features three active modes: high, low, and terminate, as
well as a high impedance inhibit state. The inhibit state, in
conjunction with the integrated dynamic clamps, facilitates
significant attenuation of transmission line reflections when the
driver is not actively terminating the line. The open-circuit drive
capability is −1.5 V to +4.5 V to accommodate a standard range
of ATE and instrumentation applications.
The ADATE320 can be used as a dual, single-ended pin
electronics channel or as a single differential channel. In
addition to per channel high speed window comparators, the
ADATE320 provides a programmable threshold differential
comparator for differential ATE applications.
All dc levels for DCL and PPMU functions are generated by
dedicated, on-chip, 16-bit DACs. To facilitate the programming
of accurate levels, the ADATE320 includes an integrated
calibration function to correct for the gain and offset errors of
each functional block. Correction coefficients can be stored on
chip, and any values written to the DACs adjust automatically
using the appropriate correction factors.
The ADATE320 uses a serial programmable interface (SPI) bus
to program all functional blocks, DACs, and on-chip calibration
constants. It also has an on-chip temperature sensor and overvolt-
age/undervoltage fault clamps that monitor and report the
device temperature and any output pin or transient PPMU
voltage faults that may occur during operation.
The ADATE320 is available in two options. The standard option
has high speed comparator outputs with 250 mV output swing.
The ADATE320-1 has 400 mV output swing. See the Ordering
Guide for more information.
Rev. B
Document Feedback
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibilityisassumedbyAnalogDevices for itsuse,nor foranyinfringementsofpatentsor other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700 ©2015–2016 Analog Devices, Inc. All rights reserved.
Technical Support
www.analog.com
1 page  
ADATE320
Data Sheet
SPECIFICATIONS
VCC = 8.0 V, VDD = 1.8 V, VEE = −5.0 V, VTTCx = VTTDx = 1.2 V, VREF = 2.500 V, VREFGND = 0.000 V. All default test conditions are as defined in
Table 30. All specified values are at TJ = 60°C, where TJ corresponds to the typical internal temperature sensor reading (VTHERM pin), unless
otherwise noted. Temperature coefficients are measured around TJ = 40°C, 60°C, 80°C, and 100°C. Typical values are based on the
statistical mean of the design, simulation analyses, and/or limited bench evaluation data. Typical values are neither tested nor guaranteed.
Test level codes are defined in the Explanation of Test Levels section.
ELECTRICAL SPECIFICATIONS
Table 1.
Parameter
DUTx PIN CHARACTERISTICS
Output Leakage Current
DCL Disable
PPMU Range E
PPMU Range A to
Range D
Driver High-Z Mode
Capacitance
Voltage Range
POWER SUPPLIES
Positive DCL Supply, VCC
Negative DCL Supply, VEE
Digital Supply, VDD
Comparator Termination,
VTTCx
Driver Termination, VTTDx
Positive DCL Supply
Current, ICC
ADATE320
ADATE320-1
Negative DCL Supply
Current, IEE
ADATE320
ADATE320-1
Digital Core Supply
Current, IDD
Comparator Termination
Supply Current, VTTCx
ADATE320
ADATE320-1
Driver Termination Supply
Current, VTTDx
Total Power Dissipation
ADATE320
ADATE320-1
Min Typ Max Unit Test Level Test Conditions/Comments
−10.0 +5.0 +10.0 nA
5.0 nA
−0.4 +0.4 µA
0.4 pF
−1.5 +4.5 V
7.6 8.0 8.4 V
−5.25 −5.0 −4.75 V
1.7 1.8 1.9 V
0.5 1.2 1.8 V
0.0 1.2 1.8 V
P
CT
P
S
D
D
D
D
D
D
145 169 185 mA P
145 169 185 mA P
190 222 235 mA
220 247 265 mA
−125 +10 +125 μA
P
P
P
41 mA CT
66 mA CT
0 mA CT
2.10 2.52 2.75 W
2.25 2.66 2.90 W
P
P
−1.5 V < VDUTx < +4.5 V, PPMU and DCL disabled, PPMU
Range E, VCLx = −2.5 V, VCHx = +7.5 V
−1.5 V < VDUTx < +4.5 V, PPMU and DCL disabled, PPMU Range A,
Range B, Range C, and Range D, VCLx = −2.5 V, VCHx = +7.5 V
−1.5 V < VDUTx < +4.5 V, PPMU disabled and DCL enabled,
RCV active, VCLx = −2.5 V, VCHx = +7.5 V
Drive VITx = 0.0 V
Power measured with the DUTx pin high-Z, 10 K to 0.0 V
Defines dc power supply rejection (PSR) conditions
Defines dc PSR conditions
VTTC0 is not electrically connected to VTTC1
VTTD0 is not electrically connected to VTTD1
Load and PPMU power-down
Load and PPMU power-down
Quiescent (SPI is static)
0.5 V ≤ VTTCx ≤ 1.8 V
0.0 V ≤ VTTDx ≤ 1.8 V, (DATx + DATx)/2 = (RCVx + RCVx)/2 = VTTDx
Load and PPMU power-down
Rev. B | Page 4 of 82
5 Page 
ADATE320
Data Sheet
DIFFERENTIAL MODE COMPARATOR (DMC) SPECIFICATIONS
Table 5.
Parameter
DC SPECIFICATIONS
Input Voltage Range
Functional Differential Range
Maximum Differential Input
Input Offset Voltage
Input Offset Voltage TC
Gain
Gain TC
VOHx, VOLx Resolution
VOHx, VOLx DNL
VOHx, VOLx INL
Uncertainty Band
Programmable Hysteresis
Hysteresis Resolution
Common-Mode Rejection Ratio
(CMRR)
DC PSR
AC SPECIFICATIONS
Propagation Delay
Propagation Delay TC
Propagation Delay Matching
High Transition to Low
Transition
Propagation Delay Matching
High to Low Comparator
Propagation Delay Dispersion
Slew Rate: 400 ps vs. 1 ns
(20% to 80%)
Overdrive: 250 mV vs. 750 mV
1.0 V Pulse Width: 0.7 ns,
1.0 ns, 5.0 ns, 10 ns
0.5 V Pulse Width: 0.6 ns,
1.0 ns, 5.0 ns, 10 ns
Min
−1.5
±0.05
−250
1.0
−8
−1.0
Typ
±150
±40
153
±250
11
200
4
±5
580
2
15
15
30
25
25
25
Max
+4.5
±1.1
±6.0
+250
1.1
+8
+1.0
Unit
V
V
V
mV
µV/°C
V/V
ppm/°C
µV
µV
mV
mV
mV
Bits
mV/V
mV/V
ps
ps/°C
ps
ps
ps
ps
ps
ps
Test
Level
D
D
D
P
CT
P
CT
D
CT
P
CB
CB
D
P
CT
CB
CT
CB
CB
CB
CB
CB
CB
Test Conditions/Comments
VOHx tests at VOLx = −1.5 V, VOLx tests at VOHx = 1.5 V
Offset interpolated from measurements at DAC Code 0x2666
(−1.0 V) and DAC Code 0x5999 (1.0 V), with VCM = 0.0 V
Gain derived from measurements at DAC Code 0x2666
(−1.0 V) and DAC Code 0x5999 (1.0 V); based on an ideal
DAC transfer function (see Table 24)
After two-point gain/offset calibration; VCM = 0.0 V;
calibration points at DAC Code 0x2666 (−1.0 V) and
DAC Code 0x5999 (1.0 V)
After two-point gain/offset calibration; VCM = 0.0 V;
calibration points DAC Code 0x2666 (−1.0 V) and
DAC Code 0x5999 (1.0 V), measured over VOHx/VOLx
range of −1.1 V to +1.1 V
VDUTx = 0.0 V, sweep comparator threshold to determine
the uncertainty band
∆Offset measured at VCM = −1.5 V and +4.5 V, VDM = 0.0 V
∆Offset measured at VCM = 0.0 V, VDM = calibration points
DAC Code 0x2666 (−1.0 V) and DAC Code 0x5999 (1.0 V)
All ac tests are performed after dc levels calibration; input
transition time = 50 ps 20% to 80%; outputs terminated
50 Ω to VTTCx, comparator CLC set to ¼ scale (010)
VDUT0 = 0.0 V, VDUT1 = −0.5 V to +0.5 V swing, drive
termination mode, VIT = 0.0 V, comparator threshold =
0.0 V, repeat with VDUTx inputs reversed
VDUT0 = 0.0 V, VDUT1 = −0.5 V to +0.5 V swing, drive
termination mode, VIT = 0.0 V, comparator threshold =
0.0 V, repeat with VDUTx inputs reversed
VDUT0 = 0.0 V, VDUT1 = −0.5 V to +0.5 V swing, drive
termination mode, VIT = 0.0 V, comparator threshold =
0.0 V, repeat with VDUTx inputs reversed
VDUT0 = 0.0 V, VDUT1 = −0.5 V to +0.5 V swing, drive
termination mode, VIT = 0.0 V, comparator threshold =
0.0 V, repeat with VDUTx inputs reversed
VDUT0 = 0.0 V, VIT = 0.0 V, drive termination mode, repeat
with VDUTx inputs reversed
VDUT1 = −0.5 V to +0.5 V swing, comparator threshold = 0.0 V
For 250 mV: VDUT1 = 0.0 V to 0.5 V swing; for 750 mV: VDUT1 =
0.0 V to 1.0 V swing, comparator threshold = −0.25 V,
repeat with VDUTx inputs reversed with comparator
threshold = +0.25 V
VDUT1 = −0.5 V to +0.5 V swing, 32 MHz, comparator
threshold = 0.0 V
VDUT1 = −0.25 V to +0.25 V swing, 32 MHz, comparator
threshold = 0.0 V
Rev. B | Page 10 of 82
11 Page | ||
| Páginas | Total 30 Páginas | |
| PDF Descargar | [ Datasheet ADATE320.PDF ] | |
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