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PDF 8413S12B Data sheet ( Hoja de datos )

Número de pieza 8413S12B
Descripción HCSL/ LVCMOS Clock Generator
Fabricantes IDT 
Logotipo IDT Logotipo



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No Preview Available ! 8413S12B Hoja de datos, Descripción, Manual

HCSL/ LVCMOS Clock Generator
8413S12B
General Description
The 8413S12B is a PLL-based clock generator. This high
performance device is optimized to generate the processor core
reference clock, the PCI-Express, sRIO, XAUI, SerDes reference
clocks and the clocks for both the Gigabit Ethernet MAC and PHY.
The clock generator offers ultra low-jitter, low-skew clock outputs.
The output frequencies are generated from a 25MHz external input
source or an external 25MHz parallel resonant crystal. The industrial
temperature range of the 8413S12B supports telecommunication,
networking, and storage requirements.
Applications
CPE Gateway Design
Home Media Servers
802.11n AP or Gateway
Soho Secure Gateway
Soho SME Gateway
Wireless Soho and SME VPN Solutions
Wired and Wireless Network Security
Web Servers and Exchange Servers
Pin Assignment
Features
Ten selectable 100MHz, 125MHz, 156.25MHz and 312.5MHz
clocks for PCI Express, sRIO and GbE, HCSL interface levels
One single-ended QG LVCMOS/LVTTL clock output at 125MHz
One single-ended QF LVCMOS/LVTTL clock output at 50MHz,
15output impedance
Two single-ended QREFx LVCMOS/LVTTL outputs at 25MHz,
15output impedance
Selectable external crystal or differential (single-ended) input
source
Crystal oscillator interface designed for 25MHz, parallel resonant
crystal
Differential CLK, nCLK input pair that can accept: LVPECL, LVDS,
LVHSTL, HCSL input levels
Internal resistor bias on nCLK pin allows the user to drive CLK
input with external single-ended (LVCMOS/ LVTTL) input levels
Supply Modes, (125MHz QG output and 25MHz QREFx outputs):
Core / Output
3.3V / 3.3V
3.3V / 2.5V
Supply Modes, (HCSL outputs, and 50MHz QF output):
Core / Output
3.3V / 3.3V
-40°C to 85°C ambient operating temperature
Available in Lead-free (RoHS 6) package
GND
FSEL_A0
FSEL_A1
FSEL_B0
FSEL_B1
FSEL_C0
FSEL_C1
FSEL_D0
FSEL_D1
FSEL_E0
VDDA
FSEL_E1
nc
XTAL_IN
XTAL_OUT
nc
REF_SEL
GND
72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55
1 54
2 53
3 52
4 51
5 50
6 ;;;;;;
7
49
48
8 47
9
10
6
46
45
11 44
12 43
13 42
14 41
15 40
16 39
17 38
18 37
19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36
nc
VDD
IREF
OE_D
nQD1
QD1
nQD0
QD0
VDDO_D
VDDO_C
nQC1
QC1
nQC0
QC0
OE_C
VDD
GND
nc
SLQPP[PP/4)33DFNDJH
©2016 Integrated Device Technology, Inc.
1
Revision E, August 18, 2016

1 page




8413S12B pdf
Function Tables
Table 3A. FSEL_X Control Input Function Table
Input
Output Frequency
FSEL_X[0:1]
Q[Ax:Ex], nQ[Ax:Ex]
00 (default)
100MHz
01 125MHz
10 156.25MHz
11 312.50MHz
NOTE: FSEL_X denotes FSEL_A, _B, _C, _D, _E.
NOTE Any two outputs operated at the same frequency will be
synchronous.
Table 3B. PLL_SEL Control Input Function Table
Input
PLL_SEL
Operation
0 PLL Bypass
1 (default)
PLL Mode
Table 3C. REF_SEL Control Input Function Table
Input
REF_SEL
Clock Source
0 CLK, nCLK
1 (default)
XTAL_IN, XTAL_OUT
8413S12B Datasheet.
Table 3D. OE_[A:E] Control Input Function Table
Input
Outputs
OE_[A:E]
Q[Ax:Ex], nQ[Ax:Ex]
0 High-Impedance
1 (default)
Enabled
Table 3E. OE_G Control Input Function Table
Input
Outputs
OE_G
QG
0 High-Impedance
1 (default)
Enabled
Table 3F. OE_REF Control Input Function Table
Input
Output
OE_REF
QREF[0:1]
0 High-Impedance
1 (default)
Enabled
©2016 Integrated Device Technology, Inc.
5
Revision E, August 18, 2016

5 Page





8413S12B arduino
8413S12B Datasheet.
Table 7G. HCSL AC Characteristics, VDD = 3.3V ± 5%, VDDO_[A:E] = VDDO_F = 3.3V ± 5%; and
VDD = 3.3V ± 5%, VDDO_G = VDDO_QREF = 3.3V ± 5% or 2.5V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Output Configurations
Outputs
Minimum Typical
RJ Random Jitter
QA = QD = 100MHz,
QB = QG = 125MHz,
QC = QE = 156.25MHz,
QF = 50MHz,
QREF0 = QREF1 = 25MHz
QA, nQA
QB, nQB
QC, nQC
QD, nQD
QE, nQE
3
3
3
3
3
DJ Deterministic Jitter
QA = QD = 100MHz,
QB = QG = 125MHz,
QC = QE = 156.25MHz,
QF = 50MHz,
QREF0 = QREF1 = 25MHz
QA, nQA
QB, nQB
QC, nQC
QD, nQD
QE, nQE
20
43
64
30
70
RMS Phase Jitter, (Random)
Integration Range:
(10kHz to 1.5MHz)
QA, nQA;
QD, nQD
0.66
tjit(Ø)
RMS Phase Jitter, (Random)
Integration Range:
(1.5MHz to 50MHz)
RMS Phase Jitter, (Random)
Integration Range:
(20MHz to 78.125MHz)
QA = QD = 100MHz,
QB = QG = 125MHz,
QC = QE = 156.25MHz,
QF = 50MHz,
QREF0 = QREF1 = 25MHz
QA, nQA;
QD, nQD
QC, nQC;
QE, nQE
0.56
0.34
RMS Phase Jitter, (Random)
Integration Range:
(12kHz to 50MHz)
QC, nQC;
QE, nQE
0.85
Maximum
5
5
5
5
5
50
100
100
80
120
Units
ps
ps
ps
ps
ps
ps
ps
ps
ps
ps
0.76 ps
0.68 ps
0.48 ps
0.95 ps
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
NOTE: Refer to Applications Section for peak-to-peak jitter calculations.
©2016 Integrated Device Technology, Inc.
11
Revision E, August 18, 2016

11 Page







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